DSPIC33FJ128GP706A-I/PT是MICROCHIP的一款8 kB RAM 128 kB 閃存 16位 數字信號控制器,采用TQFP-64貼片封裝,昆山東森微電子有限公司專業代理單片機,并可為您提供電路設計 程序開發等服務.以下DSPIC33FJ128GP706A-I/PT性能簡介:

Operating Conditions
• 3.0V to 3.6V, -40oC to +150oC, DC to 20 MIPS
• 3.0V to 3.6V, -40oC to +125oC, DC to 40 MIPS

Core: 16-bit dsPIC33F CPU
• Code-efficient (C and Assembly) architecture
• Two 40-bit wide accumulators
• Single-cycle (MAC/MPY) with dual data fetch
• Single-cycle mixed-sign MUL plus hardware divide

Clock Management
• ±2% internal oscillator
• Programmable PLLs and oscillator clock sources
• Fail-Safe Clock Monitor (FSCM)
• Independent Watchdog Timer (WDT)
• Fast wake-up and start-up

Power Management
• Low-power management modes (Sleep, Idle,Doze)
• Integrated Power-on Reset and Brown-out Reset
• 2.1 mA/MHz dynamic current (typical)
• 50 μA IPD current (typical)

Advanced Analog Features
• Two ADC modules:
- Configurable as 10-bit, 1.1 Msps with four S&H or 12-bit, 500 ksps with one S&H
- 18 analog inputs on 64-pin devices and up to 32 analog inputs on 100-pin devices
• Flexible and independent ADC trigger sources

Timers/Output Compare/Input Capture
• Up to nine 16-bit timers/counters. Can pair up to make four 32-bit timers.
• Eight Output Compare modules configurable as timers/counters
• Eight Input Capture modules

Communication Interfaces
• Two UART modules (10 Mbps)
- With support for LIN 2.0 protocols and IrDA®
• Two 4-wire SPI modules (15 Mbps)
• Up to two I2C™ modules (up to 1 Mbaud) with SMBus support
• Up to two Enhanced CAN (ECAN) modules
(1 Mbaud) with 2.0B support
• Data Converter Interface (DCI) module with I2S codec support Input/Output
• Sink/Source up to 10 mA (pin specific) for standard VOH/VOL, up to 16 mA (pin specific) for non-standard VOH1
• 5V-tolerant pins
• Selectable open drain, pull-ups, and pull-downs
• Up to 5 mA overvoltage clamp current
• External interrupts on all I/O pins

Qualification and Class B Support
• AEC-Q100 REVG (Grade 1 -40oC to +125oC)
• AEC-Q100 REVG (Grade 0 -40oC to +150oC)
• Class B Safety Library, IEC 60730

Debugger Development Support
• In-circuit and in-application programming
• Two program and two complex data breakpoints
• IEEE 1149.2-compatible (JTAG) boundary scan
• Trace and run-time watch